| 摘要 |
A single pattern-matching algorithm which allows both exact and inexact pattern-matching so that transistor-level design automation tools can reliably perform timing analysis, electrical rules checking, noise analysis, test pattern generation, formal design verification, and the like prior to manufacturing custom logic. The user (circuit designer) specifies which of each of the pattern external nets may be matched inexactly (attached to Vdd, attached to GND, and shorted to other external nets), with the remainder of the pattern external net connections being matched using exact isomorphism constraints. The method described herein achieves a substantial reduction in the number of patterns which circuit designers must generate, and altogether eliminates the need for an exponential number of patterns by providing an inexact pattern matcher to circuit designers. It further provides rooted sub-graph isomorphism so that a user can query whether a particular pattern is embedded at a particular location in the main circuit design, utilizing inexact sub-graph isomorphism
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