| 摘要 |
An apparatus for measuring the distance to a reflective surface. A first light source transmits a first light onto the reflective surface, the first light source being located on a first side of an axis. The reflective surface reflects at least a portion of the light onto a first light-detecting device having a first region operable to receive the reflected first light from the reflective surface. The first light-detecting device transmits a first and second signals as a function of the location of the received first light within the first region. A second light source transmits a second light onto the reflective surface, the second light source being located on a second side of the axis. The reflective surface reflects at least a portion of the second light onto a second light-detecting device having a second region operable to receive the reflected second light from the reflective surface. The second light-detecting device transmits a third and fourth signals as a function of the location of the received light within the second region. A processing device is coupled with the first and second light-detecting devices to respectively receive the first, second, third, and fourth signals. The processing device transmits a position signal indicative of the distance to the reflected surface as a function of the first, second, third, and fourth signals.
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