发明名称 Method of fabricating semiconductor device having trench interconnection
摘要 A semiconductor device having a trench interconnection is formed by providing a semiconductor substrate with an insulating film formed thereon. A trench is formed in the insulating film, and an amorphous phase barrier film of WSixNy or WCxNy in an amorphous phase is formed.
申请公布号 US6472318(B2) 申请公布日期 2002.10.29
申请号 US20010921050 申请日期 2001.08.02
申请人 NEC CORPORATION 发明人 UENO KAZUYOSHI
分类号 H01L21/28;H01L21/285;H01L21/3205;H01L21/768;H01L23/52;H01L23/532;(IPC1-7):H01L21/302 主分类号 H01L21/28
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