| 摘要 |
PURPOSE: A combination structure between a waveguide and a micro-strip line is provided to reduce a loss of insertion and prevent generation of errors due to movement of a probe by reducing a length of a micro-strip line. CONSTITUTION: A probe(113) is formed at a micro-strip line(111) of an E-plane probe(110). The probe(113) is formed at an end portion of an upper face of a dielectric material(115) toward an inner side of the dielectric material(115). The width of the probe(113) is narrower than the width of the micro-strip line(111). The dielectric material(115) of the E-plane probe(110) is extended to one side of the inside of a waveguide(130). The probe(113) performs a matching function since the width of the probe(113) is narrower than the width of the micro-strip line(111). An end portion of the dielectric material(115) of the E-plane probe is inserted into the inside of a main body(120). The end portion of the dielectric material(115) is fixed by a groove(121) formed at the inside of the main body(120).
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