| 摘要 |
PURPOSE: A thickness and electrical conductivity measuring apparatus is provided to simplify measuring operation of a test object which is subject to deformation, without movement of the test object. CONSTITUTION: The measuring apparatus includes an anvil(12) provided at one side thereof for laying a test object. At the other side of the anvil, a spindle(13) is provided for vertical movement related to the anvil. A thimble(14) is coupled to the spindle(13) for moving forward and backward by the rotation thereof. A conductive layer is provided at one side of the anvil and the spindle, in which an electrical path from the anvil to the spindle is electrically blocked. Thus, the apparatus is capable of measuring the electrical conductivity of the test object such as a solid polymer electrolyte plate, interposed between the anvil and the spindle.
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