发明名称 POLISHING COMPOSITION AND POLISHING METHOD USING THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a polishing composition which can obtain a superior surface by polishing, at a high speed, a semiconductor device which has a layer made of a tantalum contained compound and a layer made of copper, on a substrate. SOLUTION: A polishing composition contains (a) abrasives, (b) a free radical scavenger, (c) a polishing actuator, (d) anticorrosives, (e) a hydrogen peroxide, and (f) water, and a polishing method using the same is also provided. The (b) free radical scavenger prevents generation of surface defects such as recesses by scavenging a free radical such as hydroxy radical generated during polishing.</p>
申请公布号 JP2002313759(A) 申请公布日期 2002.10.25
申请号 JP20010119602 申请日期 2001.04.18
申请人 FUJIMI INC 发明人 ASANO HIROSHI;KITAMURA TADAHIRO;ONO KOJI;SAKAI KENJI;INA KATSUYOSHI
分类号 B24B37/00;C09K3/14;H01L21/304;(IPC1-7):H01L21/304 主分类号 B24B37/00
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