发明名称 LASER ANNEALING METHOD FOR SEMICONDUCTOR FILM
摘要 <p>PROBLEM TO BE SOLVED: To provide an excimer laser annealing method(ELA) for obtaining a p-Si good in crystallinity in the ELA for forming the p-Si for p-Si TFT LCDs. SOLUTION: In a scanning direction of a laser beam, it has an energy region exceeding a threshold energy Eth which maximizes the grain size comparatively in the front of a beam profile and an energy region not exceeding the threshold energy at sufficiently back. As the beam moves, the irradiation energy goes from up to down the threshold energy level and, in this process, the best annealing is performed in an energy region sufficiently increasing the grain size just under the threshold energy.</p>
申请公布号 JP2002313726(A) 申请公布日期 2002.10.25
申请号 JP20020039684 申请日期 2002.02.18
申请人 SANYO ELECTRIC CO LTD 发明人 OGATA KENSHU;WAKITA MASARU;YONEDA KIYOSHI;MORIMOTO YOSHIHIRO;YAMADA TSUTOMU;IMAO KAZUHIRO;KUWABARA TAKASHI
分类号 G02F1/1368;H01L21/20;H01L21/268;H01L21/336;H01L29/786;(IPC1-7):H01L21/20;G02F1/136 主分类号 G02F1/1368
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