| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method capable of measuring the magnetic layer thickness and its standard deviation in a high density magnetic recording medium with high accuracy. SOLUTION: This method for measuring the magnetic layer thickness of a magnetic recording medium having a magnetic layer and a nonmagnetic layer adjacent to each other, to linearly analyze a characteristic X-ray derived from elements included in the magnetic layer and/or the nonmagnetic layer with respect to the cross section of the magnetic recording medium in the thickness direction of the magnetic recording medium by using a wavelength dispersion type X-ray spectroscopy, to calculate the ratio of the spectrum half value width of the magnetic layer or the nonmagnetic layer or the ration of the spectrum half value width of the magnetic layer and the nonmagnetic layer to the total of the magnetic layer and the nonmagnetic layer from an obtained spectrum half value width, and to calculate the magnetic layer thickness from the obtained ratios and the total thickness of the magnetic layer and the nonmagnetic layer.</p> |
