发明名称 |
PLASMA TREATING EQUIPMENT, PLASMA TREATING METHOD, THIN FILM FORMED BY THE EQUIPMENT AND THE METHOD, SUBSTRATE AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To solve the problem that an excessive or too small an electric filed is generated in the vicinity of gap on a surface of each small electrode which is generated by superposition of high frequencies applied to each of the small electrode, in the case that a high frequency electrode is only divided into a plurality of the small electrodes, so that it is insufficient for generating a uni form plasma. SOLUTION: In this plasma treating equipment, phase adjusters 102, 104 are arranged corresponding to a plurality of the small electrodes 22, 24 for constituting high frequency electrodes. Adjustment is performed in such a manner that deviation in phases of high frequency voltages to be applied to the respective small electrodes is in a range of 120-140 degree, thereby improving distribution of film thickness and distribution of the etching speed. |
申请公布号 |
JP2002313744(A) |
申请公布日期 |
2002.10.25 |
申请号 |
JP20010120954 |
申请日期 |
2001.04.19 |
申请人 |
SHARP CORP |
发明人 |
WADA KENJI;MORITA HARUYUKI |
分类号 |
H05H1/46;B01J19/08;C23C16/505;H01L21/205;H01L21/302;H01L21/3065;H01L21/31 |
主分类号 |
H05H1/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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