发明名称 METHOD OF FORMING FINE PATTERN, SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To etch substrates having different open area ratios while suppressing fluctuations in processing shape to form a fine pattern. SOLUTION: The method for forming a fine pattern includes steps of forming an interlayer insulating film in a substrate and forming a plurality of holes in the interlayer insulating film by etching. The open area ratio of the fine pattern is adjusted by involving a dummy hole in the holes.
申请公布号 JP2002313908(A) 申请公布日期 2002.10.25
申请号 JP20010113902 申请日期 2001.04.12
申请人 MITSUBISHI ELECTRIC CORP 发明人 MORI KIYOSHI
分类号 H01L21/3205;H01L21/768;H01L21/82;H01L21/8242;H01L23/52;(IPC1-7):H01L21/768;H01L21/320 主分类号 H01L21/3205
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