发明名称 Transferring apparatus and substrate processing apparatus
摘要 A cleaning apparatus 11 includes a cleaning bath 30 for cleaning wafers W, a wafer guide 31 moving up and down to accommodate the wafers W in the cleaning bath 30, a motor 49 for moving the wafer guide 31 up and down, an absolute encoder 33 for detecting the position of the wafer guide 31, a driver 62 and a controller 63. The absolute encoder 33 detects a rotational angle of a rotating shaft 53 of the motor 49 and outputs a detection signal to the driver 62. Based on this detection signal, the driver 62 detects the position of the wafer guide 31 and further outputs the positional information of the wafer guide 31 to the controller 63. Thus, the invention provides a transferring apparatus and a substrate processing apparatus both of which allow of easy detection of the wafer guide and further facilitate their maintenance.
申请公布号 US2002153098(A1) 申请公布日期 2002.10.24
申请号 US20010998431 申请日期 2001.11.28
申请人 TOKYO ELECTRON LIMITED 发明人 KURODA OSAMU;OGAMI TAKAYUKI
分类号 B08B3/04;B25J9/10;H01L21/00;H01L21/304;H01L21/677;(IPC1-7):C23F1/00;C23C16/00 主分类号 B08B3/04
代理机构 代理人
主权项
地址