发明名称 Multi-layer structure and method for forming a thermal interface with low contact resistance between a microelectronic component package and heat sink
摘要 A multi-layer solid structure and method for forming a thermal interface between a microelectronic component package and a heat sink so that the structure has a total thermal resistance of no greater than about 0.03° C.-in2/W at a pressure of less than 100 psi. The structure comprises at least two metallic layers each of high thermal conductivity with one of the two layers having phase change properties for establishing low thermal resistance at the interface junction between the microelectronic component package and the heat sink.
申请公布号 US2002154485(A1) 申请公布日期 2002.10.24
申请号 US20020116573 申请日期 2002.04.04
申请人 THERMAGON INC. 发明人 HILL RICHARD F.;STRADER JASON L.
分类号 H01L23/427;(IPC1-7):H05K7/20 主分类号 H01L23/427
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