发明名称 Device and method for testing and calibrating multi-meters in a cathode ray tube production line
摘要 A jig can be used to site-test the accuracy of multi-meters that are used to measure resistances in a cathode ray tube production line without having to remove those multi-meters from the production line or ship them to a third party service provider for the testing. The jig is a box of electronics that includes a variety of known resistance loads that can be selected and then measured by a multi-meter to test and/or calibrate that meter. The jig includes a number of known resistance loads, a device for selecting a particular resistance load and electric contacts for connecting a multi-meter to the jig so that the meter can measure the selected and known resistance load. By comparing the measured and known resistance values, the accuracy of the multi-meter is tested.
申请公布号 US2002153903(A1) 申请公布日期 2002.10.24
申请号 US20010839282 申请日期 2001.04.20
申请人 SONY CORPORATION AND SONY ELECTRONICS INC. 发明人 MURTISHAW DAVID ALLEN;CATALDO DAVID MICHAEL;BRENDEL WALTER A.
分类号 G01R31/25;G01R35/00;(IPC1-7):G01R35/00 主分类号 G01R31/25
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