发明名称 |
Device and method for testing and calibrating multi-meters in a cathode ray tube production line |
摘要 |
A jig can be used to site-test the accuracy of multi-meters that are used to measure resistances in a cathode ray tube production line without having to remove those multi-meters from the production line or ship them to a third party service provider for the testing. The jig is a box of electronics that includes a variety of known resistance loads that can be selected and then measured by a multi-meter to test and/or calibrate that meter. The jig includes a number of known resistance loads, a device for selecting a particular resistance load and electric contacts for connecting a multi-meter to the jig so that the meter can measure the selected and known resistance load. By comparing the measured and known resistance values, the accuracy of the multi-meter is tested.
|
申请公布号 |
US2002153903(A1) |
申请公布日期 |
2002.10.24 |
申请号 |
US20010839282 |
申请日期 |
2001.04.20 |
申请人 |
SONY CORPORATION AND SONY ELECTRONICS INC. |
发明人 |
MURTISHAW DAVID ALLEN;CATALDO DAVID MICHAEL;BRENDEL WALTER A. |
分类号 |
G01R31/25;G01R35/00;(IPC1-7):G01R35/00 |
主分类号 |
G01R31/25 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|