| 摘要 |
<p>A system and method for testing a flash memory device (10) having uniform sectors (4, 5, 6) and smaller, "boot" sectors (0, 1, 2) includes determining uniform and boot test limits based on average erase (24) and APDE (28) time periods of the uniform (4, 5, 6) and boot sectors (0-2) respectively. In this way, the erase test results (24) for each sector type is compared (36) against test limits that are based only on that sector type, thereby avoiding excessive false rejects.</p> |
