发明名称 SENSING DEVICE FOR SEMICONDUCTOR PHYSICAL QUANTITY
摘要 <p>PROBLEM TO BE SOLVED: To manufacture at a low cost in a CMOS manufacturing process and perform electrical trimming with a few numbers of terminals in a sensing device for a semiconductor physical quantity. SOLUTION: The sensing device for the semiconductor physical quantity is provided with a Wheatstone bridge circuit 15 of a sensor element, an auxiliary memory circuit 12 that stores tentative trimming data, a main memory circuit 13 that stores fixed trimming data, and an adjusting circuit 14 that adjusts the output characteristics of the sensor element based on the trimming data stored in the auxiliary memory circuit 12 or the main memory circuit 13. These elements and circuits are composed of only an active element and a passive element that are manufactured by the CMOS manufacturing process and formed on the same semiconductor chip together with 7-8 pieces of terminals 21-28.</p>
申请公布号 JP2002310735(A) 申请公布日期 2002.10.23
申请号 JP20010114332 申请日期 2001.04.12
申请人 FUJI ELECTRIC CO LTD 发明人 NISHIKAWA MUTSUO;KAMIYANAGI KATSUMICHI;MORITA OSAMU;UEMATSU KATSUYUKI
分类号 G01L1/18;G01D3/00;G01D3/02;G01D18/00;G01D21/00;G01P15/12;G01P21/00;H01L21/8238;H01L27/092;H01L29/84;(IPC1-7):G01D21/00;H01L21/823 主分类号 G01L1/18
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