发明名称 |
SIGNAL DETECTING DEVICE BY SCANNING PROBE, PROBE MICROSCOPE BY THE DEVICE, SIGNAL DETECTING METHOD BY SCANNING PROBE AND OBSERVING METHOD FOR OBSERVING SAMPLE SURFACE USING THE METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a signal detecting method by a scanning probe, a probe microscope by the device, a signal detecting method by the scanning probe, and an observing method for observing a sample surface using the method capable of simplifying adjustment work in signal detection and easily coping with dispersion of resonance frequencies between probes. SOLUTION: In the signal detecting device or method by a non-contact scanning probe, a means of detecting a signal of a shift amount of a resonance frequency of a probe converts the detected signal of the shift amount of the resonance frequency of the probe into a low band side signal without changing the shift amount. It has a composition having a frequency changing circuit raising a signal ratio of the shift amount of the resonance frequency of the probe, and a frequency/voltage converting circuit raising strength of the raised frequency shift amount of the signal ratio and converting it into voltage. |
申请公布号 |
JP2002310882(A) |
申请公布日期 |
2002.10.23 |
申请号 |
JP20010118241 |
申请日期 |
2001.04.17 |
申请人 |
CANON INC |
发明人 |
ITSUJI TAKEAKI;SHITO SHUNICHI |
分类号 |
G01B21/30;G01Q60/24;G01Q60/32;G01Q70/00;G01Q90/00;(IPC1-7):G01N13/16;G01N13/10 |
主分类号 |
G01B21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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