发明名称 METHOD OF MEASURING WAVELENGTH SELECTIVE SCATTERED LIGHT
摘要 PROBLEM TO BE SOLVED: To accurately measure the haze ratio of a transparent substrate even when the substrate has the peak of light scattering intensity in a wavelength region apart from the visual center wavelength seen in a transparent body containing scattered fine particles. SOLUTION: The total light transmittance T1 and diffused light transmittance T2 of the transparent substrate at every wavelength are measured by using an integrating sphere and the haze ratio (%) of the substrate at every wavelength is found based on T2/T1×100 (%).
申请公布号 JP2002310902(A) 申请公布日期 2002.10.23
申请号 JP20010116764 申请日期 2001.04.16
申请人 CENTRAL GLASS CO LTD 发明人 TANAKA KATSUTO
分类号 G01J3/50;G01N21/27;(IPC1-7):G01N21/27 主分类号 G01J3/50
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