发明名称 POLISHING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a polishing device and method capable of obtaining stability of a polishing speed and excellent flatness, and excellently reducing defects (scratches) generated on a polishing face of a polishing target object such as a semiconductor wafer to various kinds of the polishing target objects. SOLUTION: This polishing device polishes the polishing target object through abrasive grains by pressing the polishing target object onto a polishing instrument 1 and sliding the polishing target object. The polishing instrument 1 includes a highly water absorptive material 5. As the high water absorptive material 5, polyacrylic acid, polyvinyl acetal, polyvinyl pyrralidone, polyvinyl alcohol, polyethylene imine, polyethylene oxide, a styrene-maleic anhydride copolymer, polyvinyl amine, polyallylamine, an oxazoline group-containing water-soluble resin, a water-soluble melamine resin, a water-soluble urea resin, an alkyd resin, sulfonamide or the like can be used.
申请公布号 JP2002307294(A) 申请公布日期 2002.10.23
申请号 JP20010115946 申请日期 2001.04.13
申请人 EBARA CORP 发明人 HIROKAWA KAZUTO;HIYAMA HIROKUNI;WADA TAKETAKA;MATSUO NAONORI
分类号 B24B37/20;B24B37/24;B24D3/02;B24D3/28;B24D3/34;H01L21/304 主分类号 B24B37/20
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