| 摘要 |
PROBLEM TO BE SOLVED: To enable non-defective/defective decision of each functional block to be easily executed by a little number of test/data inputting and a little number of output data bits in a short time in an integrated circuit device having a plurality of functional blocks. SOLUTION: The integrated circuit device 2 comprises a test data storage unit 3, a bus switching controller 4 for reading in parallel test data from the storage unit and imparting the read data to a plurality of functional blocks FB(1) to FB(n), each digit output data compressing unit 5 for processing to compress the outputs of the blocks at each digit, an overall digit output compressing unit 9 for further compressing the digit compressed outputs, an external output interface unit 10 for outputting the outputs of the overall digit output compressing unit to an external terminal, and a test command controller 8 receiving the test command from the tester to control the command. Thus, the tester side inputs a test command, compares the output data of the external output terminal with an expected value, and executes the non-defective/defective decision of the integrated circuit device. |
