发明名称 Method of fabricating HBT devices
摘要 <p>A method of fabricating an HBT transistor with extremely high speed and low operating current. The transistor has a small base area and a small emitter area with most of the emitter area contacted with metal, most of the base area, outside of the emitter, contacted with metal and a collector ohmic metal placed close to the device emitter and the base ohmic metal. To achieve this, the method includes partially undercutting the base ohmic metal along all external edges to reduce the device's parasitic base-collector capacitance. In order to provide metal step coverage, the undercut of the base ohmic metal can be covered with a sloped edge polymer. In addition, a Schottky diode can be fabricated within the process steps used to form the HBT transistor without additional process steps being needed to build the Schottky diode. &lt;IMAGE&gt;</p>
申请公布号 EP1251555(A2) 申请公布日期 2002.10.23
申请号 EP20020008252 申请日期 2002.04.18
申请人 NORTHROP GRUMMAN CORPORATION 发明人 LAMMERT, MICHAEL D.
分类号 H01L21/28;H01L21/329;H01L21/331;H01L21/8222;H01L27/06;H01L29/47;H01L29/737;H01L29/872;(IPC1-7):H01L21/331 主分类号 H01L21/28
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