发明名称 |
POLISHING DEVICE, POLISHING PAD, POLISHING METHOD AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To selectively radiate polishing heat generated in a polishing pad to improve in-surface temperature uniformity of a substrate, and to improve in-surface uniformity of a polishing rate. SOLUTION: In this polishing device, cooling water piping 6 cools a surface plate 5. The polishing pad 1 disposed on the surface plate 5 includes a base member and metal particles 11 having expansibility and heat conductivity higher than the base member. In the polishing pad 1, because the metal particles 11 in a high-temperature part thermally expand to contact with each other, the heat conductivity is variable. |
申请公布号 |
JP2002307297(A) |
申请公布日期 |
2002.10.23 |
申请号 |
JP20010112498 |
申请日期 |
2001.04.11 |
申请人 |
SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC |
发明人 |
SUZUKI YOSHITOMO |
分类号 |
B24B37/015;B24B37/20;B24B37/24;H01L21/304 |
主分类号 |
B24B37/015 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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