发明名称 POLISHING DEVICE, POLISHING PAD, POLISHING METHOD AND MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To selectively radiate polishing heat generated in a polishing pad to improve in-surface temperature uniformity of a substrate, and to improve in-surface uniformity of a polishing rate. SOLUTION: In this polishing device, cooling water piping 6 cools a surface plate 5. The polishing pad 1 disposed on the surface plate 5 includes a base member and metal particles 11 having expansibility and heat conductivity higher than the base member. In the polishing pad 1, because the metal particles 11 in a high-temperature part thermally expand to contact with each other, the heat conductivity is variable.
申请公布号 JP2002307297(A) 申请公布日期 2002.10.23
申请号 JP20010112498 申请日期 2001.04.11
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC 发明人 SUZUKI YOSHITOMO
分类号 B24B37/015;B24B37/20;B24B37/24;H01L21/304 主分类号 B24B37/015
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