发明名称 MEASUREMENT METHOD FOR MEASURING FLEXURE AMPLITUDE OF TOUCH PROBE
摘要 PROBLEM TO BE SOLVED: To provide a measuring method, capable of taking into consideration of a deformation in a touch probe during a measurement cycle. SOLUTION: This method is used for calibrating a tool comprising the touch probe used for a contact-type measuring instrument, in order to take into consideration its dynamic shape characteristics. In particular, uncertainty related to flexural deformation of the touch probe can be measured accurately by this method.
申请公布号 JP2002310636(A) 申请公布日期 2002.10.23
申请号 JP20020099989 申请日期 2002.04.02
申请人 SAPHIRWERK INDUSTRIEPRODUKTE AG 发明人 DUBOIS DANIEL
分类号 G01B21/00;G01B5/012;G01B5/30;G01B21/04;(IPC1-7):G01B21/00 主分类号 G01B21/00
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