发明名称 SURFACE SHAPE MEASURING METHOD AND SURFACE SHAPE MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide a surface shape measuring method, and a surface shape measuring instrument capable of obtaining a highly accurate measurement result using a simple device constitution. SOLUTION: A surface roughness measuring method measures the surface roughness of a measuring object surface 11 by measuring the reflected light from the measuring object surface 11 by using a focal error detecting method and has a first process BS of branching off the reflected light from the measuring object surface 11 in two directions, a second process S2 (2PD-1, 13) for obtaining detecting light output by extracting a part corresponding to displacement of the measuring object surface from a light-receiving state of the branched-off one reflected light, a third process S3 (2PD-2, 14) of obtaining reference light output by detecting a light-receiving state of other reflected light of the branched-off as it is, and a fourth process S4 (17) of obtaining the difference between the detecting light output and the reference light output.
申请公布号 JP2002310623(A) 申请公布日期 2002.10.23
申请号 JP20010109334 申请日期 2001.04.06
申请人 FOTONIKUSU:KK 发明人 FUKATSU HIROYA
分类号 G01B11/24;(IPC1-7):G01B11/24 主分类号 G01B11/24
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