发明名称 INTEGRAL SPHERE, SPECTRAL MEASURING DEVICE USING THE SAME, SPECTRAL MEASURING METHOD AND SEMICONDUCTOR MANUFACTURING EXPOSURE PRINTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a spectral measuring device superior in the measuring precision of light of a far ultraviolet, vacuum ultraviolet and soft X ray area. SOLUTION: In the spectral measuring device for measuring the intensity and distribution of the spectral energy of light in which the wavelength area of the light to be measured is 300 nm or less by using an integral sphere 7, a phosphor coat containing inorganic phosphor particles and fluorine resin particles in the whole or a part of the inner face of the integral sphere 7 is provided. The fluorine resin constituting the phosphor coat provided on the inner face of the integral sphere is tetrafluoroethylene resin, its derivative and their copolymer resin.
申请公布号 JP2002310798(A) 申请公布日期 2002.10.23
申请号 JP20010112617 申请日期 2001.04.11
申请人 CANON INC 发明人 KATO HIDEO;OKUBO MASASHI
分类号 G01J3/443;G03F7/20;H01L21/027;(IPC1-7):G01J3/443 主分类号 G01J3/443
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