发明名称 PASSIVATION OF GAN BASED FETS
摘要 <p>Surface passivation of GaN based FETs, including undoped AlGaN/GaN HEMTs and MISFETs, and doped GaN MESFETs, reduces or eliminates the surface effects responsible for limiting both the RF current and breakdown voltages of the devices. Passivation is provided through deposition of a layer (32) made of a dielectric, such as silicon nitride, silicon dioxide or polyimide, on a barrier layer (16) between a source (24) and a drain (25) of the FET (10).</p>
申请公布号 EP1208607(A4) 申请公布日期 2002.10.23
申请号 EP20000957262 申请日期 2000.08.16
申请人 CORNELL RESEARCH FOUNDATION, INC. 发明人 SHEALY, JAMES, R.;GREEN, BRUCE, M.;EASTMAN, LESTER, F.
分类号 H01L21/285;H01L21/335;H01L21/338;H01L23/522;H01L29/20;H01L29/778;H01L29/812;(IPC1-7):H01L31/032 主分类号 H01L21/285
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