发明名称 |
PASSIVATION OF GAN BASED FETS |
摘要 |
<p>Surface passivation of GaN based FETs, including undoped AlGaN/GaN HEMTs and MISFETs, and doped GaN MESFETs, reduces or eliminates the surface effects responsible for limiting both the RF current and breakdown voltages of the devices. Passivation is provided through deposition of a layer (32) made of a dielectric, such as silicon nitride, silicon dioxide or polyimide, on a barrier layer (16) between a source (24) and a drain (25) of the FET (10).</p> |
申请公布号 |
EP1208607(A4) |
申请公布日期 |
2002.10.23 |
申请号 |
EP20000957262 |
申请日期 |
2000.08.16 |
申请人 |
CORNELL RESEARCH FOUNDATION, INC. |
发明人 |
SHEALY, JAMES, R.;GREEN, BRUCE, M.;EASTMAN, LESTER, F. |
分类号 |
H01L21/285;H01L21/335;H01L21/338;H01L23/522;H01L29/20;H01L29/778;H01L29/812;(IPC1-7):H01L31/032 |
主分类号 |
H01L21/285 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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