发明名称 Fabrication method of capacitor for integrated circuit
摘要 A method for fabricating a capacitor for an integrated circuit, comprising the steps of forming a titanium film for an adhesion layer over a substrate, forming a titanium dioxide film for a diffusion barrier layer by annealing the titanium film after ion-implantation of oxygen ion into a surface region of the titanium film so as to change titanium in the surface region to titanium dioxide, and forming a high dielectric constant capacitor on the titanium dioxide film.
申请公布号 US6468875(B2) 申请公布日期 2002.10.22
申请号 US20010768170 申请日期 2001.01.24
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 UEMOTO YASUHIRO;FUJII EIJI;ARITA KOJI;NAGANO YOSHIHISA;SHIMADA YASUHIRO;AZUMA MASAMICHI;INOUE ATSUO;IZUTSU YASUFUMI
分类号 H01L21/02;H01L21/314;H01L27/115;(IPC1-7):H01L21/20 主分类号 H01L21/02
代理机构 代理人
主权项
地址