发明名称 Backside contact for integrated circuit and method of forming same
摘要 A contact formed from the backside of an integrated circuit device includes a first conductive layer on a first surface of the integrated circuit device and a second conductive layer on a second surface of the device. The two conductive layers are coupled by way of an opening through the semiconductor substrate separating the two conductive layers. A method for making the backside contact comprises forming the first conductive layer, forming an opening through the semiconductor substrate to expose at least a portion of the underside of the first conductive layer, then filling the opening with a conductive material to provide an electrical contact to the first conductive layer from the backside of the integrated circuit device.
申请公布号 US6468889(B1) 申请公布日期 2002.10.22
申请号 US20000633931 申请日期 2000.08.08
申请人 ADVANCED MICRO DEVICES, INC. 发明人 IACOPONI JOHN A.;MIETHKE JOHN C.
分类号 H01L23/52;H01L21/3205;H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L23/52
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