发明名称 Conductive interconnect structures and methods for forming conductive interconnect structures
摘要 Interconnect structures and methods for making interconnect structures are disclosed. A typical interconnect structure has a tapered first end portion having a first substantially planar surface and a concave surface adjacent to the first planar surface. A second end portion of the interconnect structure includes a second substantially planar surface. The second planar surface has a larger area than the first planar surface. An intermediate portion is disposed between the first end portion and the second end portion.
申请公布号 US6469394(B1) 申请公布日期 2002.10.22
申请号 US20000494756 申请日期 2000.01.31
申请人 FUJITSU LIMITED 发明人 WONG CONNIE M.;LEE MICHAEL G.
分类号 H01L21/60;H01L23/485;H01L23/498;H05K3/07;H05K3/24;H05K3/34;H05K3/40;(IPC1-7):H01L23/48 主分类号 H01L21/60
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