发明名称 |
Conductive interconnect structures and methods for forming conductive interconnect structures |
摘要 |
Interconnect structures and methods for making interconnect structures are disclosed. A typical interconnect structure has a tapered first end portion having a first substantially planar surface and a concave surface adjacent to the first planar surface. A second end portion of the interconnect structure includes a second substantially planar surface. The second planar surface has a larger area than the first planar surface. An intermediate portion is disposed between the first end portion and the second end portion.
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申请公布号 |
US6469394(B1) |
申请公布日期 |
2002.10.22 |
申请号 |
US20000494756 |
申请日期 |
2000.01.31 |
申请人 |
FUJITSU LIMITED |
发明人 |
WONG CONNIE M.;LEE MICHAEL G. |
分类号 |
H01L21/60;H01L23/485;H01L23/498;H05K3/07;H05K3/24;H05K3/34;H05K3/40;(IPC1-7):H01L23/48 |
主分类号 |
H01L21/60 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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