发明名称 SOI type MOS element and manufacturing method thereof
摘要 To present a SOI type MOS element excellent in yield, performance and characteristic, easy in manufacture, and low in cost, and a method of manufacturing the same. A SOI type MOS transistor structure comprising polysilicon electrodes 128 for gate, source and drain composed by burying into trench holes 120a, 120b, 120c respectively formed in a semiconductor substrate 110, a gate oxide film 122 formed in the entire inside of the trench hole 120a, N-diffusion layer 124 and N+ diffusion layer 126 formed in the entire inside of the trench holes 120b and 120c, and a thick SiO2 film 114 in a trench hole 113 formed in the semiconductor substrate 110 so as to surround the transistor.
申请公布号 US6469349(B2) 申请公布日期 2002.10.22
申请号 US20010865475 申请日期 2001.05.29
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 MURAKAMI NORIO
分类号 H01L21/336;H01L21/8238;H01L27/092;H01L29/78;(IPC1-7):H01L27/01;H01L27/12;H01L31/039 主分类号 H01L21/336
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