发明名称 Method and apparatus for determining measurement frequency based on hardware age and usage
摘要 A processing line includes a processing tool, a measurement tool, and an automatic process controller. The processing tool is adapted to process articles. The measurement tool is adapted to measure a characteristic of selected articles at a measurement frequency. The automatic process controller is adapted to change the measurement frequency based on a usage characteristic of the processing tool. A method for monitoring a processing tool includes processing a plurality of articles in the processing tool; measuring a characteristic of selected articles at a measurement frequency; and changing the measurement frequency based on a usage characteristic of the processing tool.
申请公布号 US6469518(B1) 申请公布日期 2002.10.22
申请号 US20000479180 申请日期 2000.01.07
申请人 ADVANCED MICRO DEVICES, INC. 发明人 DAVIS BRADLEY M.;EVANS ALLEN L.;CHRISTIAN CRAIG W.
分类号 H01L21/02;H01L21/66;(IPC1-7):G01R27/00;G05B13/02;G06F19/00 主分类号 H01L21/02
代理机构 代理人
主权项
地址