发明名称 Method of chemical/mechanical polishing of the surface of semiconductor device
摘要 The surface of a semiconductor device is polished by first supplying a polishing pad with a slurry that contains a solvent, abrasive grains, and an additive for making the viscosity of the slurry variable so that the top portion of the polishing pad is soaked with the slurry, then supplying the polishing pad with a viscosity modifier for increasing the viscosity of the slurry and hardening the top portion of the polishing pad soaked with the slurry, and finally polishing the surface of the semiconductor device with the slurry having its viscosity increased and the polishing pad having its top portion hardened.
申请公布号 US6468911(B1) 申请公布日期 2002.10.22
申请号 US20000655918 申请日期 2000.09.06
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MIYASHITA NAOTO;NISHIOKA TAKESHI
分类号 H01L21/304;C09G1/02;H01L21/321;(IPC1-7):H01L21/00 主分类号 H01L21/304
代理机构 代理人
主权项
地址
您可能感兴趣的专利