发明名称 |
STRUCTURE OF INTERCONNECTION INSULATING LAYER USING HYDROGEN-SILSESQUIOXANE AND METHOD OF FORMING THE SAME |
摘要 |
PURPOSE: A structure of an interconnection insulating layer using Hydrogen Silsesquioxane(HSQ) is provided to improve filling-up characteristic of via holes by filling HSQ only between neighboring wires. CONSTITUTION: The interconnection insulating layer(100) is covered with plural interconnection patterns(200) composed of a conducting pattern(120), a barrier metal pattern(130) and a diffusion barrier pattern(140) and an interconnection insulating pattern(151) is surrounded by them. The plural interconnection patterns are covered with an interlayer dielectric(160), containing via holes(170) through it ,exposing the metal barrier layer and filled up by a via plug.
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申请公布号 |
KR20020078997(A) |
申请公布日期 |
2002.10.19 |
申请号 |
KR20010019526 |
申请日期 |
2001.04.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHO, GWANG RAE |
分类号 |
H01L21/316;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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