发明名称 METHOD OF DELINEATION OF NOTCHED GATE IN eDRAM SUPPORT DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a complementary metal-oxide film semiconductor integrated circuit which contains a notched gate in a support device region, and to provide a method of forming the integrated circuit. SOLUTION: A gate stack 16 is formed on a substrate, a patterned mask 24 is formed on the gate stack, the stack gate is etched by using the mask, and rather than the entire part but a part of a gate conductor is removed. A gap-filling film 28 is formed on the whole face, and the gap-filling film is removed in such a way that the gap filling film is left between masked gate stacks in an array device region. A spacer is formed on the exposed sidewall of the masked gate stack, and the exposed gate conductor inside the array device region and inside the support device region is removed. An undercut is formed in the lower exposed part of the remaining gate conductor. The remaining gap filling film is removed from the masked protective gate stack inside the array device region.
申请公布号 JP2002305287(A) 申请公布日期 2002.10.18
申请号 JP20020016927 申请日期 2002.01.25
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 MANDELMAN JACK A;RADENS CARL J
分类号 H01L27/108;H01L21/28;H01L21/8234;H01L21/8238;H01L21/8242;H01L27/088;H01L27/092;H01L27/10;H01L29/423;H01L29/43;H01L29/49;(IPC1-7):H01L27/10;H01L21/823 主分类号 H01L27/108
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