JIG FOR MEASURING X-RAY SPECTRUM

摘要

PROBLEM TO BE SOLVED: To provide a jig by which a scattered X-ray spectrum can be measured with satisfactory efficiency even with reference to low-energy X-rays and to provide a scatterer. SOLUTION: A jig 20a and a jig 20b are used to measure the X-ray spectrum. They are composed of a scatterer 21a and a scatterer 21b composed of carbon and a support member 22c and a support member 22d used to support the scatterers 21a, 21b. The scatterers 21a, 21b have a shape obtained by cutting a cylindrical body at 45 deg. with reference to its axis or a conical shape.