发明名称 |
FACE TYPE WAVELENGTH SELECTIVE FILTER AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a face-type wavelength selective filter which operates at a desired transmission wavelength. SOLUTION: The face-type wavelength selective filter 40 has a lower DBR mirror 44 consisting of a semiconductor multilayered film of 28 pairs of AlAs layers each having 135 nm film thickness and GaAs layers each having 114 nm film thickness, a resonance medium 46 consisting of Gax In1-x N1-y-z Asy Sbz (wherein x=0.87, y=0.95 and z=0.01), and an upper DBR mirror 48 consisting of a semiconductor multilayered film of 23 pairs of AlAs layers each having 135 nm film thickness and GaAs layers each having 114 nm film thickness, as the resonator structure on a GaAs substrate 42. A SiN film 50 is formed as an antireflection film of the substrate surface on the back face of the GaAs substrate. The obtained face-type wavelength selective filter functions as a wavelength selective filter having the transmission peak wavelength at about 1.55μm.
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申请公布号 |
JP2002303721(A) |
申请公布日期 |
2002.10.18 |
申请号 |
JP20010106883 |
申请日期 |
2001.04.05 |
申请人 |
FURUKAWA ELECTRIC CO LTD:THE |
发明人 |
YOKOUCHI NORIYUKI;SHIMIZU HITOSHI |
分类号 |
G02B5/28;H01S5/183;(IPC1-7):G02B5/28 |
主分类号 |
G02B5/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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