发明名称 ALIGNER AND METHOD FOR EXPOSURE
摘要 <p>PROBLEM TO BE SOLVED: To provide an aligner and a method for exposure where the sufficient rigidity of a mask holder is ensured and a mask pattern is transferred precisely, even if a grazing-incidence measuring means is used to measure the height of a mask. SOLUTION: The face of a mask 1, facing opposite the pattern face thereof, is held in contact with a face of the mask holder 2 on the side of a projection optical system 8; in addition, the mounting face for a mask faces toward the projection optical system; and therefore, the distance from the projection optical system is easy to measure, and the accuracy of the mask mounting face is measured and corrected easily.</p>
申请公布号 JP2002305138(A) 申请公布日期 2002.10.18
申请号 JP20010107430 申请日期 2001.04.05
申请人 NIKON CORP 发明人 HIRAYANAGI NORIYUKI
分类号 G03B27/42;G03F1/20;G03F7/20;H01L21/027;(IPC1-7):H01L21/027;G03F1/16 主分类号 G03B27/42
代理机构 代理人
主权项
地址