发明名称 CONTACTOR DEVICE FOR SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
摘要 <p>A contactor device including a first contactor (2) and a second contactor (4) is electrically connectable with a plurality of semiconductor devices formed on a semiconductor wafer (6). The first contactor (2) has a contact (2b) for direct electrical contact with a power supply terminal (6a) of the semiconductor device. The second contactor (4), which is movable relative to the first contactor (2), has a contact (4a) for electrical contact with a signal terminal (6b) of the semiconductor device. The contactor device reduces the number of contacts to be formed in one contactor, and thus the number of wiring patterns decreases, facilitating the manufacture of contactors.</p>
申请公布号 WO2002082528(P1) 申请公布日期 2002.10.17
申请号 JP2001002924 申请日期 2001.04.04
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