| 摘要 |
<p>The invention provides a method of characterizing the shape of a mirror (12), comprising: characterizing each of a plurality of characterization locations on the mirror (12) by observing reflection of a respective light beam (24a-24d) from each of the locations; whereby further locations on the mirror can be characterized on the basis of the characterization locations. This method is further used to align one or more mirrors (34) by simulating said mirror(s) and light reflections on the basis of the characterizations and comparing said simulated light reflection with a predetermined pattern of light reflection, and varying said simulated array until simulated light reflection is within acceptable tolerances of preferred pattern of light reflection.</p> |
