发明名称 CHEMICAL CONCENTRATION CONTROL DEVICE
摘要 <p>A system (500) and method for ensuring constant concentration ratios in multi-fluid mixtures used in wafer processing steps. In one aspect the invention is a method for supplying a multi-fluid mixture to a process tank (330) comprising: transporting a first fluid through a first supply line (110) having means to control mass flow rate of the first fluid; transporting a second fluid through a second supply line (210) having means to control mass flow rate of the second fluid; converging the first and second fluids to form a multi-fluid mixture; repetitively measuring the concentration levels of the first and second fluids in the multi-fluid mixture with a sensor (310); and upon the sensor (310) detecting undesirable concentration levels of either the first or second fluid in the multi-fluid mixture, automatically adjusting the mass flow rate of at least one of the first and second fluids to achieve desired concentration levels.</p>
申请公布号 WO2002082509(A1) 申请公布日期 2002.10.17
申请号 US2002011150 申请日期 2002.04.08
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