| 摘要 |
<p>A control device test system including an electrical switch and a device controller, wherein the device controller has a processor, a memory coupled to the processor, and an auxiliary input coupled to the processor and adapted to receive a binary signal from the electrical switch. A routine is stored in the memory of the processor and is adapted to be executed on the processor to cause a control device test to be performed in response to the receipt of the binary signal at the input.</p> |
