发明名称 Insulating film for semiconductor device and semiconductor device
摘要 To provide an insulating film having a low dielectric constant and performance sufficient as an interlayer insulating film of a semiconductor device, and a semiconductor device using the insulating film. An insulating film for a semiconductor device used as an interlayer insulating film of a semiconductor device, the insulating film consisting essentially of poly- alpha , alpha -difluoroparaxylylene and having a relative dielectric constant of from 2.1 to 2.7. An insulating film for a semiconductor device used as an interlayer insulating film of a semiconductor device, the insulating film consisting essentially of poly- alpha , alpha -difluoroparaxylylene and exhibiting a step coverage of from 0.4 to 0.9. An insulating film for a semiconductor device capable of being filled in a gap, the insulating film consisting essentially of poly- alpha , alpha -difluoroparaxylylene, having a ratio (D/L) of a depth (D) and an opening width (L) of 1 or more.
申请公布号 EP0966039(A3) 申请公布日期 2002.10.16
申请号 EP19990300284 申请日期 1999.01.15
申请人 KISHIMOTO SANGYO CO., LTD.;DAISANKASEI CO.,LTD. 发明人 KIMOTO, HISAO;MOCHIZUKI, TSUTOMU
分类号 C08G61/12;H01B3/30;H01L21/31;H01L21/312;H01L21/768;H01L23/522;H01L23/532 主分类号 C08G61/12
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