发明名称 |
Device and method for controlling focussed electron beams |
摘要 |
<p>The device includes a field emitter beam source (4-2) with an emitter (4-3) and an extraction electrode (4-4) to generate an electron beam. An anode accelerates the electrons of the beam towards a specimen. Focussing components (4-5) focus the beam onto the specimen. A control circuit (4-30) senses deviation of an actual current value of the electron beam from a desired value. The control circuit controls a voltage V1 between the emitter and the extraction electrode to adjust the actual current value of the electron beam. The control circuit controls a second voltage V2 to adjust the actual focus position of the beam. Independent claims are also included for the following: (a) a method for controlling an electron beam; (b) a method for controlling electron beams; (c) a method for controlling an array of electron beams.</p> |
申请公布号 |
EP1249855(A1) |
申请公布日期 |
2002.10.16 |
申请号 |
EP20010108868 |
申请日期 |
2001.04.09 |
申请人 |
ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUER HALBLEITERPRUEFTECHNIK MBH |
发明人 |
ADAMEC, PAVEL;WINKLER, DIETER |
分类号 |
H01J37/073;H01J37/304;(IPC1-7):H01J37/304 |
主分类号 |
H01J37/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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