发明名称 INSPECTION SYSTEM FOR MEDICAL APPARATUS AND INSPECTION METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a system quickly detecting abnormality of a medical apparatus, shortening the time for restoration and taking a proper counter measure to eliminate a down time over a long time. SOLUTION: This inspection system for the medical apparatus is provided with a means for generating an image using data for inspection prepared in advance (steps 40, 41) and a means for comparing the image generated by this means with a reference image prepared in advance to judge whether the presence or absence of an abnormality (steps 42 to 46). Preferably, a means for taking a measure related to the restoration of the abnormality in accordance with the results of judgement is provided.
申请公布号 JP2002301060(A) 申请公布日期 2002.10.15
申请号 JP20020027475 申请日期 2002.02.04
申请人 TOSHIBA CORP 发明人 TANAKA SHIGERU
分类号 A61B6/03;(IPC1-7):A61B6/03 主分类号 A61B6/03
代理机构 代理人
主权项
地址