发明名称 Simultaneous formation of charge storage and bitline to wordline isolation
摘要 One aspect of the present invention relates to a method of forming a non-volatile semiconductor memory device, involving the sequential or non-sequential steps of forming a charge trapping dielectric over a substrate, the substrate having a core region and a periphery region; removing at least a portion of the charge trapping dielectric in the periphery region; forming a gate dielectric in the periphery region; forming buried bitlines in the core region; and forming gates in the core region and the periphery region.
申请公布号 US6465306(B1) 申请公布日期 2002.10.15
申请号 US20000723635 申请日期 2000.11.28
申请人 ADVANCED MICRO DEVICES, INC.;FUJITSU LIMITED 发明人 RAMSBEY MARK T.;YANG JEAN Y.;SHIRAIWA HIDEHIKO;VAN BUSKIRK MICHAEL A.;ROGERS DAVID M.;SUNKAVALLI RAVI;WANG JANET;DERHACOBIAN NARBEH;WU YIDER
分类号 H01L21/8247;H01L21/8246;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/336 主分类号 H01L21/8247
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