发明名称 RESIST COATING METHOD, THIN-FILM FORMING METHOD AND METHOD OF MANUFACTURING ELECTRO-OPTICAL DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a resist coating method, a thin-film forming method and a method of manufacturing an electro-optical device, by which a resist film can be reliably formed on a substrate having projections and depressions, without leaving uncoated regions. SOLUTION: This thin-film forming method comprises a step of forming a subject metal film (5) on a substrate (2), a first resist coating step of coating the metal film with a first resist, (7) having viscosity lower than reference viscosity, a second resist coating step of coating the first resist with a second resist (8) having the reference viscosity. and a step of forming a thin film having a prescribed pattern, by using a resist film constituted by the first resist and the second resist, to selectively eliminate the metal film by photolithographic method. Applying the first resist having lower viscosity first prevents occurrence of resist uncoated regions on the substrate which already has projections and depressions.
申请公布号 JP2002299199(A) 申请公布日期 2002.10.11
申请号 JP20010094086 申请日期 2001.03.28
申请人 SEIKO EPSON CORP 发明人 IWATA SHINICHI
分类号 G03F7/095;B05D1/36;B05D1/40;G03F7/105;G03F7/16;H01L21/027 主分类号 G03F7/095
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