发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND ITS FABRICATING METHOD
摘要 PROBLEM TO BE SOLVED: To confirm correct writing of additional information for enhancing traceability easily and surely in a short time even if the volume of the additional information is increased. SOLUTION: The semiconductor integrated circuit device comprises parity check logic circuits 10a-10d, and fuse circuits 20-27 for writing additional information. The fuse circuits 20-27 are provided at a redundancy fuse repairing section 12 and written, as additional information, with a format code, the start year of wiring, a month code of wiring lot, the wiring lot number, the wiring lot number suffix, the wafer number, the chip address, and the trimming information. A parity bit is written in the least significant bit of the additional information and, at the time of shipment, the parity check logic circuits 10a-10d perform parity check of the additional information and only a semiconductor integrated circuit device 1 written with correct additional information is shipped.
申请公布号 JP2002299561(A) 申请公布日期 2002.10.11
申请号 JP20010099324 申请日期 2001.03.30
申请人 HITACHI LTD;HITACHI ULSI SYSTEMS CO LTD 发明人 TSUBAKI TAKASHI;KITAMURA NOBUAKI;NAKAYAMA MICHIAKI;MIYAOKA SHUICHI
分类号 G01R31/28;G11C11/401;G11C29/00;G11C29/04;H01L21/02;H01L21/82;H01L21/822;H01L27/04;(IPC1-7):H01L27/04 主分类号 G01R31/28
代理机构 代理人
主权项
地址