发明名称 |
ETCHING METHOD AND APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide an etching method and an etching apparatus which ensure stable etch rate. SOLUTION: While a specified gas is introduced from a gas feeder 2 into a vacuum chamber 1, a turbomolecular pump 3 which is an evacuation means evacuates this chamber to keep a fixed pressure therein and a high frequency power source 4 feeds a coil 6 disposed inside a dielectric tube 5 a high-frequency power of 13.56 MHz to generate a plasma in the chamber 1, thereby etching a high melting point metal film, formed on a substrate 8 mounted on a substrate electrode 7 with the plasma. |
申请公布号 |
JP2002299325(A) |
申请公布日期 |
2002.10.11 |
申请号 |
JP20010105443 |
申请日期 |
2001.04.04 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
OKUMURA TOMOHIRO;KAI TAKAYUKI;YASHIRO YOICHIRO |
分类号 |
C23F4/00;C30B33/12;H01J37/32;H01L21/28;H01L21/302;H01L21/3065;H01L21/3213;H01L21/8242;H01L21/8246;H01L27/105;H01L27/108 |
主分类号 |
C23F4/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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