发明名称 ACTIVE MATRIX TYPE DISPLAY DEVICE AND INSPECTION METHOD THEREFOR
摘要 PURPOSE: To provide a display device in which a defect inspection that is in line with the actual display condition is easily conducted. CONSTITUTION: While a switching first transistor Tr1 is turned on by a gate signal, a holding capacitor C1 holds its voltage signal according to the data voltage signals inputted to the source terminal of the transistor Tr1. A second transistor Tr2 controls the amount of current, that flows into light emitting elements from a power supply line PVdd line according to the voltage signals. At that time, an adding capacitor C2 accumulates electric charges according to the amount of current being controlled. Thus, a defect inspection that is made suitable to an actual display condition is conducted by inspecting the electric charges.
申请公布号 KR20020077070(A) 申请公布日期 2002.10.11
申请号 KR20020015243 申请日期 2002.03.21
申请人 SANYO ELECTRIC CO., LTD. 发明人 JINNO YUSHI
分类号 G09F9/30;G02F1/136;G09F9/00;G09G3/00;G09G3/20;G09G3/32;H01L27/32;H01L29/786;(IPC1-7):G02F1/136 主分类号 G09F9/30
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