发明名称 |
SEMICONDUCTOR DEVICE INCLUDING DIFFUSION BARRIER FORMED BETWEEN METAL PATTERN AND INTERLAYER DIELECTRIC AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A semiconductor device including a diffusion barrier formed between a metal pattern and an interlayer dielectric and a method for fabricating the same are provided to prevent contraction of a metal pattern by forming a diffusion barrier between floating oxide layers formed between the metal pattern and the metal pattern. CONSTITUTION: An interlayer dielectric(10) is formed on a semiconductor substrate. A metal pattern(12) is formed on the interlayer dielectric(10). A fire-resistant metal layer is formed on a whole surface of the semiconductor substrate. A spacer(14) is formed on a sidewall of the metal pattern(12). A thermal process is performed on the semiconductor substrate during 10 minutes to 3 hours. A diffusion barrier(16) is formed by combining oxygen component of the spacer(14) with metallic component of the metal pattern(12). A floating oxide layer(18) is formed thereon. The thermal process is performed on the floating oxide layer(18).
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申请公布号 |
KR20020076475(A) |
申请公布日期 |
2002.10.11 |
申请号 |
KR20010016328 |
申请日期 |
2001.03.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG, SEONG MAN;KO, JANG MAN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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