发明名称 PLL CIRCUIT AND ITS LOCK DECISION CIRCUIT, AND TEST METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a lock decision circuit for a PLL circuit that accurately detects a locked/unlocked state on the basis of a multiplied signal generated by the PLL circuit. SOLUTION: The lock discrimination circuit is provided with a comparator circuit 23 that compares whether or not a result of count by an up-down counter 24 for counting number of cycles of an output signal over a prescribed cycle period of an input signal X1 of the PLL circuit 10 is coincident with a value (a value of a multiple number latch register 22) depending on a multiple number of the PLL circuit 10 and the prescribed count period, compares whether or not a result of subtraction from the result of count every time the output signal is counted by one cycle over a succeeding count period of the input signal X1 is coincident with zero (a value of a '0' value latch register 21) and outputs a decision signal denoting a lock state when both the comparison results indicate the coincidence.
申请公布号 JP2002300029(A) 申请公布日期 2002.10.11
申请号 JP20010096536 申请日期 2001.03.29
申请人 NEC CORP 发明人 KUHARA SHIGERU
分类号 H03L7/089;H03L7/095 主分类号 H03L7/089
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